Home / Tech Trends / Booz Allen, SAIC, MITRE Assess Arlington Cemetery’s Processes, Technology

Booz Allen, SAIC, MITRE Assess Arlington Cemetery’s Processes, Technology

Image: Alexandr Shebanov

Booz Allen Hamilton, SAIC and The MITRE Corporation are collaborating with 13 other members of Northern Virginia Technology Council to conduct a 60-day pro-bono assessment of Arlington National Cemetery’s processes and technology.

The purpose of the initiative is to identify and develop solutions to restore America’s confidence in the integrity of Arlington National Cemetery. At the conclusion of this assessment, NVTC will provide its findings and recommendations to Arlington National Cemetery Executive Director Kathryn Condon and the secretary of the Army.

The 16 members of the NVTC Arlington National Cemetery Task Force are: Booz Allen Hamilton, MITRE, SAIC, Blue Canopy, Consumer Electronics Association, CGI Federal, Corporation for National Research Initiatives, CSC, The George Washington University, HP, Lee Technologies, Salient Federal Solutions, SoltecOne, Synaptitude, Unanet and Vistronix.

In August, the Department of the Army accepted NVTC’s pro-bono offer of assistance in the assessment of Arlington’s technology requirements. NVTC’s offer followed a request from Sen. Mark R. Warner (D-Va.), who sought a remedy to the massive record-keeping problems at the cemetery.

“It is gratifying to see this process moving forward with specific, common sense steps,” Warner said. “I appreciate the willingness of Army and Arlington National Cemetery officials to continue working in close partnership with these NVTC member companies. Fixing the problems at Arlington has to be everyone’s priority, and I am pleased to see this strong partnership move forward.”

Follow me on Facebook

Check Also

Northrop-NLign Analytics Team Receives DoD Award for F-35 Technical Work

The Defense Department has given the Defense Manufacturing Technology Achievement Award to the team of Northrop …

Leave a Reply

Your email address will not be published. Required fields are marked *